Pica Code IR-2026-089 CryoDefects: Understanding Defect Dynamics in Cryogenic Semiconductor Devices Using Physics-Based Modeling

Pica Code IR-2026-089 CryoDefects: Understanding Defect Dynamics in Cryogenic Semiconductor Devices Using Physics-Based Modeling Italian Ministry of Education, University and Research Engineering » Electronic engineering The research activity focuses on developing physics-based simulation methodologies to investigate degradation and reliability phenomena in semiconductor devices operating at cryogenic temperatures, with particular emphasis on dielectric breakdown. The developed methodologies will be validated...